
µMLA Maskless Aligner
CONFIGURABLE AND COMPACT TABLETOP MASKLESS ALIGNER WITH RASTER SCAN AND VECTOR EXPOSURE MODULES
Versatile Exposure Modes and Configurations
The µMLA offers flexibility through two distinct exposure modes:
Raster Scan Mode (standard): Ensures fast exposure with excellent image quality, maintaining consistent write times regardless of structure size and pattern density.
Vector Scan Mode (optional): Tailored for continuous, smooth curves, ideal for structures like waveguides, offering both speed and precision.
Three optical configurations enable a customizable balance between resolution and throughput, with easy switching to optimize for specific applications. Additional capabilities include:
Draw Mode: Allows real-time, on-the-fly adjustments to existing patterns and electrical contacts to nanowires or 2D materials.
Grayscale Mode: Supports 2.5D structuring for complex micro-optics.
The µMLA is a cutting-edge tabletop maskless lithography system, built on the robust µPG platform, which is the world’s best-selling maskless tabletop solution. Ideal as an entry-level tool for R&D and rapid prototyping, it enables high-precision microstructuring across diverse applications, including microfluidics (e.g., cell sorting devices, lab-on-a-chip), small-scale mask-writing, micro-optics and microlens arrays, sensor fabrication, MEMS, and patterning of 2D materials and fan-out electrodes.
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Installed Systems

Customer applications
Technical Data
Writing Performance | Write Mode I * | Write Mode II * | Write Mode III * |
|---|---|---|---|
2nd layer alignment over 50 x 50 mm² [nm] | 1000 | 1000 | 2000 |
2nd layer alignment over 5 x 5 mm² [nm] | 500 | 500 | 1000 |
CD uniformity [3σ, nm] | 200 | 300 | 400 |
Address grid [nm] | 20 | 50 | 100 |
Minimum lines and spaces [μm] | 0.8 | 1.5 | 3 |
Minimum structure size [μm] | 0.6 | 1 | 3 |
Write speed | with 390 nm LED / 365 nm LED | with 390 nm LED / 365 nm LED | with 390 nm LED |
|---|---|---|---|
-- | 25 mm²/min at 2 µm | 90 mm²/min at 4 µm | 240 mm²/min at 6 µm |
Optional write speeds at different minimum structure sizes with “Variable Resolution for Raster Scan Exposure Module” | 18 mm²/min at 1 µm | 60 mm²/min at 2 µm | 160 mm²/min at 4 µm |
Write speed | 10 mm²/min at 0.6 µm | 40 mm²/min at 1 µm | 100 mm²/min at 3 µm |
Writing performance | - | -- | --- |
|---|---|---|---|
Available spot sizes in Vector Mode [µm] | 0.6 / 1 / 2 / 5 / 10 | 1 / 2 / 5 / 10 / 25 | 3 / 5 / 10 / 25 /50 |
Maximum linear write speed in Vector Mode | 200 mm/s | 200 mm/s | 200 mm/s |
2nd layer alignment over 50 x 50 mm² [nm] | 1000 | 1000 | 2000 |
2nd layer alignment over 5 x 5 mm² [nm] | 500 | 500 | 1000 |
Address grid [nm] | 20 | 20 | 20 |
Minimum feature size [µm] | 0.6 | 1 | 3 |
System specifications | -- |
|---|---|
Maximum write area | 150 x 150 mm2 |
Substrate thickness | 0.1 to 12 mm |
Minimum substrate size | 5 x 5 mm2 |
Maximum substrate size | 6″ x 6″ |
Installation requirements | -- |
|---|---|
Temperature stability | ±1 °C |
Cleanroom | ISO 6 recommended |
Compressed air | 6 - 10 bar |
Electrical | 230 VAC / 6A or 110 VAC / 12A (±5%, 50/60 Hz) |
-- | Raster scan exposure module | Vector exposure module |
|---|---|---|
Light source | LED; 390 nm or 365 nm Laser; | 405 nm and/or 375 nm |
System dimensions (lithography unit) | -- | --- |
|---|---|---|
Main system housing | 640 mm (25") x 840 mm (33") | 530 mm (21") x 130 kg (285 lbs) |
µMLA | Width x Depth | Height x Weight |
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* Only one write mode can be installed on the system










