Characterisation

Characterisation systems and accessories are used to test, characterise and inspect individual dies, devices or wafer scale production. The main areas that Nano Vacuum focus' on are:

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• Thermal Vacuum Systems (TVAC) for satellite and space payload testing

• Metrology (3D Non-contact and THz spectroscopy)

• 3D Imaging

• OPV and OLED software and hardware characterisation

• Quantum Transport Measurement

• Near Ambient Pressure XPS for routine applications

• UHV surface science systems (XPS, ARPES, UPS...)